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Tenders

For tender procedures, the NanoIC project uses the procurement platform of the European Union.

All documents and details can be found below.

 

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Automatic Wafer Probers

Beol Etch Platform

Blank Wafer Inspection Tool

Cathodoluminescence (CL) Tool

CMP Platform

Electrical Measuring Equipment for Parametric Testing

Etchstrip Platform

Ion Mass Spectrometry tool

LAB FIB SEM

PVD for MRAM

Semi-Automatic Wafer Probers

Single Wafer Process Tool

Thick Dielectric Deposition Tool

Thickness Metrology Tool

Wafer Shape Metrology Tool

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